Exposure catalogs ================= Exposure catalogs are used for diagnostics where tangential shear around exposure centers (and later, chip centers) is measured. Currently this file is generated from an OpSim catalog, but we need to figure out how to ingest it from the LSST stack. It may change form at that point. The columns in an exposure catalog are: ========= ============== ========== ========= Group Name Kind Meaning ========= ============== ========== ========= exposures ap_corr_map_id 1D int64 exposures bgmean 1D float64 exposures bgvar 1D float64 exposures colorterm1 1D float64 exposures colorterm2 1D float64 exposures colorterm3 1D float64 exposures darktime 1D float64 exposures date-avg 1D str exposures dectel 1D float64 exposures exptime 1D float64 exposures filter 1D str exposures fluxmag0 1D float64 exposures fluxmag0err 1D float64 exposures imgtype 1D str exposures magzero_nobj 1D int64 exposures magzero_rms 1D float64 exposures mjd-obs 1D float64 exposures obsid 1D int64 exposures psf_id 1D int64 exposures ratel 1D float64 exposures rotangle 1D float64 exposures rottype 1D str exposures runnum 1D int64 exposures skywcs_id 1D int64 exposures testtype 1D str exposures timesys 1D str ========= ============== ========== =========